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TriboLab CMP




R&D-Scale Process and Material Characterization System

The TriboLab CMP delivers reliable, flexible, cost-effective bench characterization of wafer polishing processes, offering on-board diagnostics and flexibility in sample type, size, and mounting for a better understanding of CMP applications.






 

   New TriboLab CMP Process and Material Characterization System has been designed from the ground up specifically for reliable, flexible, and cost effective characterization of wafer polishing processes.




  • Reproduces full-scale wafer polishing process conditions without downtime on production equipment
  • Provides unmatched measurement repeatability and detail
  • Allows testing on small coupons for substantial cost savings over whole-wafer testing