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The New Standard in Stylus ProfilometryThe Dektak XT™ stylus profiler features a revolutionary design that enables unmatched repeatability of under five angstroms (<5Å) and up to 40% improved scanning speeds. | This major milestone in stylus profiler performance is the culmination of forty years of Dektak brand innovation and industry leadership. The remarkable breakthroughs incorporated in this tenth-generation Dektak system enable the critical nanometer-level film, step and surface measurements that will power future advances in the microelectronics, semiconductor, solar, high-brightness LED, medical, scientific and materials science markets. |