The FEI Themis transmission electron microscope (TEM) starts with our revolutionary wide high-tension range and corrector-ready platform, combined with a wide pole piece gap delivering the space to do more. Developed with stability and flexibility in mind, the Themis TEM high performance continuously enables atomic scale discovery and exploration. Combining these proven optics with new, breakthrough scanning transmission electron microscope (STEM) imaging capability and enhanced automation software enables ultimate imaging and analysis performance for all materials scientists.
Themis TEM
Based on FEI's Titan S/TEM platform – introduced in 2005 – the Themis TEM family forms the next generation of the world's most powerful, commercially available suite of S/TEM solutions for Materials Science, with Themis Z and Themis ETEM.