Fischione Instruments offers a comprehensive ion mill product line that provides multi-length scale sample preparation for a wide variety of SEM, TEM, and APT analysis techniques.
Join us Thursday, January 28, 10 a.m. EST
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Ion mills for every application webinar
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| Fischione Instruments offers a comprehensive ion mill product line that provides multi-length scale sample preparation for a wide variety of SEM, TEM, and APT analysis techniques.
Ion beam energy range
Our argon ion mill products offer a wide range of ion beam energy (from 50 eV to 10 keV), which allow both fast material removal and final polishing.
Ion beam size range
The product line also offers a broad scale of ion beam sizes (from millimeter to sub-micron) that are suitable for any application: - SEM: Adjustable ion beam size and position that can expose areas up to 50 mm in diameter
- TEM: Small ion beam size to target 3 mm specimens or FIB-prepared specimens
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REGISTER to attend the webinar
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