• Simultaneous high-angle annular dark field imaging and electron energy loss spectroscopy
• Yields Z-contrast information
  
• Single electron detection
• Fully retractable from beam path
  

High-resolution scanning transmission electron microscope imaging

The Annular Dark Field (ADF) Detector is ideal for high-resolution scanning transmission electron microscopy (STEM) imaging. It allows simultaneous high-angle ADF imaging and electron energy loss spectroscopy. It has single electron detection capabilities and high quantum efficiency. The detector is pneumatically retractable from the beam path.

Atomic-resolution imaging and Z-contrast

High-angle ADF STEM images are formed by collecting electrons that have been forward scattered through high angles. For high angles, elastic and inelastic interactions between the incident electrons and the columns of atoms within the specimen produce image contrast. Because the nuclei of the target atoms are involved, the strength of scattering varies with atomic number. The ADF Detector captures these highly scattered electrons yielding both atomic-resolution imaging and Z-contrast information.

The ADF Detector incorporates a single crystal yttrium aluminum perovskite (YAP) scintillator optically coupled to a photomultiplier tube.