Workshop topics will include talks on sample preparation, application of XPS, AES and TOF-SIMS for fundamental and applied research, use of correlative surface analysis utilizing PHI USA instruments and advances in data collection and processing. Invited speakers – our users from both academia and industry - include: Fred Stevie, North Carolina State University, USA Alberto Gomez, CINVESTAV-Queretaro, Mexico Bill Stickle, HP, USA Anass Benayard, CEA, Liten, France Peng Li, University of Alberta, Canada Nathaniel Rieders, Montana State University, USA Zhongrui Li, University of Michigan, USA Robert Hamers, University of Wisconsin-Madison, USA Cecile Courreges, University of Pau, France Sebastiaan Van Nuffel, Penn State University, USA Anja Vanleenhove, IMEC, Belgium Derrick M. Poirier, 3M, USA |
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