Synchronized beam scanning and precession diffraction
with multi-signal data acquisition
Advanced control of NanoMEGAS DigiSTAR and
external optical CCD camera
Digital STEM imaging with beam precession control
PED patterns from multiple discrete points, lines and areas
Assisted calibrations (camera length, distortion correction)
On-line distortion corrected diffraction pattern acquisition
Improved workflow Phase and Orientation Mapping
STEM image acquisition
BF / DF /HAADF from STEM detectors present on the TEM
Virtual BF/DF via external optical CCD
Video-rate imaging using external optical CCD camera
(binocular position)
Multiple scan modes (spot, line, area, …)
Fast acquisition of diffraction patterns
On-line distortion correction
Suite of image processing features
