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Digital STEM & TEM imaging

Synchronized  beam scanning and precession diffraction 

with multi-signal data acquisition

Advanced control of NanoMEGAS DigiSTAR and 

external optical CCD camera

Digital STEM imaging with beam precession control

PED patterns from  multiple discrete points, lines and areas

Assisted calibrations (camera length, distortion correction)

On-line distortion corrected diffraction pattern acquisition

Improved workflow  Phase and Orientation Mapping

STEM image acquisition

BF / DF /HAADF   from STEM detectors present on the TEM
Virtual BF/DF via external optical   CCD 

Video-rate imaging using external optical CCD camera 

(binocular position)

Multiple scan modes (spot, line, area, …)

Fast acquisition of diffraction patterns

On-line distortion correction

Suite of image processing features