Model 1050- Two independently adjustable, TrueFocus ion sources
- High energy operation for rapid milling; low energy operation for specimen polishing
- Adjustable milling angle range of ±10°
- Specimen rocking or rotation
- Liquid nitrogen-cooled specimen stage
- High-magnification microscope and digital imaging optional
Consistently produces high-quality TEM specimens
An excellent tool for creating the thin, electron transparent specimens needed for transmission electron microscopy (TEM) imaging and analysis. The TEM Mill incorporates two independently adjustable TrueFocus (patent pending) ion sources, liquid nitrogen specimen cooling, automatic gas control, and an oil-free vacuum system for ultra-clean specimen processing. The specimen holder accommodates double-sided milling to 0° without specimen shadowing. The TEM Mill features a vacuum load lock for rapid specimen exchange. Tilt angles are continuously adjustable in the range from -10° to +10°. In addition to full specimen rotation with ion beam sequencing, the programmable rocking angle control is ideal for preparing cross-section (XTEM) specimens.
Thinning to electron transparency
Ion milling is used on physical science specimens to reduce their thickness to electron transparency. Inert gas, typically Argon, is ionized and then accelerated toward the specimen surface. By means of momentum transfer, the impinging ions sputter material from the specimen at a controlled rate. Liquid nitrogen cooling of the specimen stage is highly effective in eliminating artifacts.
Advanced ion source technology
Two TrueFocus ion sources direct controlled-diameter ion beams to the specimen regardless of energy. The unique design of the TrueFocus ion source maintains a small ion beam diameter, even at a low accelerating voltage. The ion beams can be focused on either one or both specimen surfaces. When operated in the upper energy range (up to 6.0 keV), milling is rapid, even at low angles. When operated at low energy (as low as 100 eV), material is gradually sputtered from the specimen without inducing artifacts.
Programmable, automatic operation
The TEM Mill operates with minimal user intervention. It features a modular design for basic instrument operation or fully automated control. The universal control platform manages total instrument operation. The basic version of the TEM Mill is for users who require only primary level instrumentation function. The premium version adds full computer control for setting, operating, and recording a broad variety of instrument parameters. The ion milling process can be automatically terminated by temperature, by elapsed time, or by a laser photodetection system.
Enhanced viewing
The TEM Mill accepts a stereo microscope to enhance specimen viewing. The microscope's long working distance allows the specimen to be observed in situ while milling. The TEM Mill can be configured with an imaging system including a high-magnification microscope coupled to a CCD camera and video monitor to capture and display images.